Source: https://tendernation.io/opportunities/01a13bfa-cb94-7399-abed-dbe92133e463/200ye-ion-beam-facility closed GB open procedure Suitable for SMEs # 200/YE Ion Beam Facility [University of Sheffield](https://tendernation.io/buyers/university-of-sheffield) Estimated value £800,000 to £1,300,000 Published 10 Jun 2015 Deadline Closed 8 Jul 2015 ## Who can bid - Buyer says suitable for SMEs The buyer ticked “suitable for SMEs” on the notice. Anyone can still bid. - Open procedure Anyone can submit a full tender; there is no shortlisting stage. [More contracts for small businesses and VCSEs](https://tendernation.io/opportunities/for-small-businesses) ## About this tender The University of Sheffield is out to tender on behalf of the Department of Materials Science and Engineering for a Focused ion beam Facility. We seek to purchase a Dual Beam Focused Ion Beam –Scanning Electron Microscope instrument. The instrument will be used for the investigation of a wide range of materials, including polymers, metals, ceramics, glasses, composites, semiconductors, nanomaterials, nanostructures and coatings. The instrument will be used for: - The ultra-high resolution investigation of the surfaces of materials using both secondary electron (ISE and ESE) and back scattered electron signals. - The ability to examine material structure with minimal electron beam damage. - The preparation of the highest quality samples for transmission electron microscopy with the ability to undertake high resolution TEM without further sample preparation. - To undertake STEM experiments directly in the instrument. - To undertake dynamic nanoscale experiments within the microscope. - To be able to lithographically ion mill surface structures such as nano-pillars etc. - To have the option of undertaking several different analytical techniques in the microscope. - To enable the investigation of 3D materials volumes through iterative cutting and imaging of sample surfaces. For the purposes of this procurement our requirements have been divided into 3 lots as follows:- - Lot 1 – Focused Ion Beam Scanning Electron Microscope (FIB SEM) system. - Lot 2 – Cooling system for FIB SEM. - Lot 3 – Energy Dispersive spectroscopy system for FIB SEM. Suppliers are welcome to tender for one, two or all Lots. The closing date for return of tenders is Friday 10th July 2015 at 12 noon (UK time) Suppliers must register on the University's e-tendering portal in order to access the tender documents and submit their responses. [in-tendhost.co.uk/sheffield](https://www.in-tendhost.co.uk/sheffield) Additional information: All expressions of interest must be via the University of Sheffield e-tendering portal: [in-tendhost.co.uk/Sheffield](https://www.in-tendhost.co.uk/Sheffield) This is an open tender exercise. The ITT can be downloaded by registering and expressing your interest on the University`s e-tendering system [in-tendhost.co.uk/Sheffield](https://www.in-tendhost.co.uk/Sheffield) If you have any questions or comments in relation to this tender they must be submitted via the In-tend System, this can be accessed at [in-tendhost.co.uk/Sheffield](https://www.in-tendhost.co.uk/Sheffield) Completed tenders must be returned through the same e-tendering system. Closing date for receipt of tenders: Friday 10th July 2015 at 12 noon (UK time). Is a Recurrent Procurement Type? : No [in-tendhost.co.uk/sheffield/aspx](https://in-tendhost.co.uk/sheffield/aspx/) Read full description ## CPV classification Microscopes Source Contracts Finder (UK) [View official notice](https://www.contractsfinder.service.gov.uk/notice/7a2692fc-adc8-11e6-9901-0019b9f3037b) Never miss a tender like this again Get AI summaries, deadline alerts and a bid pipeline for tenders matched to your business. Free to start. 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